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 NameCategoryManufacturerModel
View 3-zone furnaceThermal processesThermo scientificLindberg Blue M
View 4-point probeCharacterizationJandelKM3-AR
View Acid Wet benchWet process benches--
View Anechoic chamberOther processesUnknown2011
View Atomic layer deposition (ALD)Plasma depositionBeneqTFS 200- 148
View Big blue tube furnaceThermal processesGero75242
View Birkeland Tube furnaceThermal processesGSL1100XGSL1100X
View Cross Section PolisherOther processesJeolIB-19520CCP
View DC Magnetron sputteringThin film depositionCVCAST-601, DC system
View DC/RF Magnetron sputteringThin film depositionSemicoreTriAxis
View E-beam and thermal PVDThin film depositionÅngstrom EngineeringEvoVac
View EllipsometerCharacterizationWoolamAlphaSE
View Farraday CageOther processesUnknown2010
View FTIRCharacterizationBrukerIFS 125HR
View High resolution powder diffractionCharacterizationBrukerD8-A25
View Image Plate DiffractometerCharacterizationHuberG670
View Ion implanterOther processesNECTandem Accelerator
View IT-300 SEMCharacterizationJEOLIT-300
View Laser CutterOther processesRoffinPL E 25 SHG CL Flex
View Leybold E-beam evaporationThin film depositionLeyboldL 560 K
View Lindberg Tube furnaceThermal processesLindberg59544
View Lithography Wet benchWet process benches--
View Low resolution transmission XRDCharacterizationBrukerD5000
View Low temperature powder XRDCharacterizationBrukerD5000
View Mask aligner 2LithographyKarl SussMJB55
View Moorefield sputterThin film depositionMoorefieldMiniLab
View MOVPE / MOCVDEpitaxyEMFTitan Reactor
View Multi Purpose Powder X-ray DiffractionCharacterizationBruker AXSD8-A25
View Network analyzer ZVA67 Network AnalyzerRohde & Schwarz2013
View Optical MicroscopeOther processesOlympusBX 41 M
View PCB-milling machineOther processesLPKF2012
View PECVDPlasma depositionAdvanced VacuumVision 310 MK II
View Probe station CharacterizationWentworth Laboratories Pegasus S200FA
View Probestation with laser cutterOther processesSignatone2012
View QSSPCCharacterizationSinton InstrumentsWCT-120 + Suns-Voc
View Rapid Thermal Processing - MicroThermal processesAnnealSysAS-Micro
View Rapid Thermal Processing - OneThermal processesAnnealSysAS-One
View RBSCharacterizationCustom made-
View Reactive Ion EtchDry etchingAdvanced VacuumVision 320 MK II
View Resist spinnerLithography-CEE 100
View Room temperature Hall (RTH)CharacterizationLake ShoreEM4 HGA
View Routine Powder DiffractionCharacterizationBruker AXSD8 Discover
View Scanning Probe MicroscopeSurface analysis & TEMNanonicsMV2000
View Single crystal X-ray diffraction (dual source)CharacterizationBrukerD8-Venture
View Small Angle ScatteringCharacterizationBrukerNanostar
View Small blue tube furnaceThermal processesGero-
View Solar simulatorCharacterizationNewport91160 Full Spectrum Solar Simulator
View Solvent Wet benchWet process benches--
View SpectrophotometerCharacterizationShimadzuSolidSpe-3700 DUV
View Stylus profilometerCharacterizationVeecoDektak 8
View Tabletop Maskless Litography/Aligner SystemLithographyHeidelberg instrumentsuPG501
View Temperature Dependent Hall (TDH)CharacterizationLakeShoreEM4 HGA
View Temperature Dependent Scanning Probe MicroscopeSurface analysis & TEMNanonicsMV2000
View Thermal evaporatorThin film depositionBalzersBAE 250
View Thin Film XRDCharacterizationPanalytical Empyrean
View Transmission powder XRDCharacterizationBrukerD5000
View Tube 1 - 4-stack furnaceThermal processesThermCoThermCo
View Tube 2 - 4-stack furnaceThermal processesThermCoThermCo
View Tube 3 - 4-stack furnaceThermal processesThermCoThermCo
View Tube 4 - 4-stack furnaceThermal processesThermCoThermCo
View UMS Huginn - FEI Titan 60-300Surface analysis & TEMFEI CompanyTitan G2 60-300
View UMS Muninn - JEOL 2100FSurface analysis & TEMJEOL2100F
View Warm cabinetThermal processes--
View WaveMaster 830Zi OscilloscopeOther processesLeCroy2010
View WirebonderDevice mountingSignatone2011
View XRDCharacterizationBrukerAXS D8 Discover
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