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 NameCategoryManufacturerModel
View 3D PrinterOther processesPrusaI3 MK3S
View 3-zone furnaceThermal processesThermo scientificLindberg Blue M
View 4-point probeCharacterizationJandelKM3-AR
View Allied MultriprepSample preparationAlliedMultiprep
View Angular-resolved UV photoemission spectroscopy (UPS) / (ARPES) - Flextura Gate 5CharacterizationSpecsFlextura
View Annealing chamber - Flextura Gate 6Thermal processesPolyteknikFlextura
View Atomic Force MicroscopyCharacterizationVeeco Digital Instruments by BrukerVeeco Dimension 3100 AFM NanosScope
View Atomic layer deposition (ALD)Thin film depositionBeneqTFS 200- 148
View CathodoluminescenceCharacterizationDelmicSPARC
View Cross Section PolisherSample preparationJeolIB-19520CCP
View DLTS setup “Asterix“CharacterizationUiONA
View DLTS setup “Idefix“CharacterizationUiONA
View DLTS setup “Obelix“CharacterizationUiONA
View DLTS setup “Tiffy“CharacterizationUiONA
View E-beam and thermal PVD - AngstromThin film depositionÅngstrom EngineeringEvoVac
View E-beam PVD - TornadoThin film depositionPolyteknikTornado 406E
View EllipsometerCharacterizationWoolamAlphaSE
View FEI Titan 60-300Surface analysis & TEMFEI CompanyTitan G2 60-300
View Fischione Model 1020Sample preparationFischioneModel 1020
View Forming gasSample preparationAGAH2/N2
View FT-IRCharacterizationBrukerIFS 125HR
View Fume hood solventsWet process benchesN/AN/A
View Gatan PIPS IISample preparationGatanPIPS II
View Hall effect - Low-temperature (Cleanroom)CharacterizationLakeShoreEM4 HGA
View Hall effect - Room-temperature (Cleanroom)CharacterizationLake ShoreEM4 HGA
View Hall effect - Room-temperature (MEMS room)CharacterizationLakeShoreHMS 7700A
View Hall effect - Variable-temperature (MEMS room)CharacterizationLakeShoreHMS 7700A
View High resolution powder diffractionCharacterizationBrukerD8-A25
View Image Plate DiffractometerCharacterizationHuberG670
View Ion implantationOther processesNECTandem Accelerator
View JEOL 2100FSurface analysis & TEMJEOL2100F
View Laser cutter - ELASSample preparationELASMASTER Mini PSG-532
View Laser Cutter - RoffinSample preparationRoffinPL E 25 SHG CL Flex
View Low energy electron diffraction (LEED) - Flextura Gate 5CharacterizationSpecsFlextura
View Low resolution transmission XRDCharacterizationBrukerD5000
View Magnetron sputter DC/RF - MoorfieldThin film depositionMoorfieldMiniLab
View Magnetron sputter DC/RF - NanoPVDThin film depositionMoorfieldNanoPVD Model S10A
View Magnetron sputter DC/RF - SemicoreThin film depositionSemicoreTriAxis
View Magnetron sputter DC/RF/HiPIMS - Flextura Gate 2Thin film depositionPolyteknikFlextura
View Magnetron sputter Remote plasma - Flextura Gate 3Thin film depositionPolyteknikFlextura
View Multi Purpose Powder X-ray DiffractionCharacterizationBruker AXSD8-A25
View Optical MicroscopeOther processesOlympusBX 41 M
View Plasma-enhanced chemical vapor deposition (PECVD)Plasma depositionAdvanced VacuumVision 310 MK II
View Probe station CharacterizationWentworth Laboratories Pegasus S200FA
View Protochips Atmosphere HolderCharacterizationProtochipsAtmosphere
View Protochips Fusion HolderCharacterizationProtochipsFusion
View Pulsed laser deposition - Combinatorial chamberThin film depositionTwente Solid State TechnologyNA
View Pulsed laser deposition - Epitaxial chamberThin film depositionTwente Solid State TechnologyNA
View Pulsed laser deposition - Excimer laserThin film depositionCoherentCompex Pro 205F
View QSSPCCharacterizationSinton InstrumentsWCT-120 + Suns-Voc
View Rapid Thermal Processing (RTP) - MicroThermal processesAnnealSysAS-Micro
View Rapid Thermal Processing (RTP) - OneThermal processesAnnealSysAS-One
View Reactive Ion Etch (RIE)Dry etchingAdvanced VacuumVision 320 MK II
View Resist spinnerLithography-CEE 100
View Routine Powder DiffractionCharacterizationBruker AXSD8 Discover
View Rutherford backscattering spectrometry (RBS)CharacterizationCustom made-
View Scanning Probe MicroscopeSurface analysis & TEMNanonicsMV2000
View SEM & EDS IT-300 CharacterizationJEOLIT-300
View Single crystal X-ray diffraction (dual source)CharacterizationBrukerD8-Venture
View Small Angle ScatteringCharacterizationBrukerNanostar
View Solar simulatorCharacterizationNewport91160 Full Spectrum Solar Simulator
View SpectrophotometerCharacterizationShimadzuSolidSpe-3700 DUV
View Steady-state photo capacitanceCharacterizationCustom madeNA
View Stylus profiler - Clean roomCharacterizationBrukerDektakXT-A
View Stylus profilometer - SIMS roomCharacterizationVeecoDektak 8
View Tabletop Maskless Litography/Aligner SystemLithographyHeidelberg instrumentsuPG501
View Temperature Dependent Scanning Probe MicroscopeSurface analysis & TEMNanonicsMV2000
View Thermal evaporatorThin film depositionBalzersBAE 250
View Thin Film XRDCharacterizationPanalytical Empyrean
View Transmission powder XRDCharacterizationBrukerD5000
View Tube 1 - 4-stack furnaceThermal processesThermCoThermCo
View Tube 2 - 4-stack furnaceThermal processesThermCoThermCo
View Tube 3 - 4-stack furnaceThermal processesThermCoThermCo
View Tube 4 - 4-stack furnaceThermal processesThermCoThermCo
View Tube furnace - Big blueThermal processesGero75242
View Tube furnace - BirkelandThermal processesGSL1100XGSL1100X
View Tube furnace - LindbergThermal processesLindberg59544
View Tube furnace - Small blueThermal processesGero-
View Warm cabinetThermal processes--
View Wet bench - AcidsWet process benches--
View Wet bench - LithographyWet process benches--
View Wet bench - RCAWet process benches--
View Wet bench - SolventsWet process benches--
View X-ray Diffraction - Rigaku SmartLabCharacterizationRigakuSmartlab
View X-ray photoemission spectroscopy (XPS) - Flextura Gate 5CharacterizationSpecsXR-50 Twin anode
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