Picture of Ellipsometer
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Material Class:

Transparent solids

Technology Description:

 

Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters and is related to a variety of sample properties. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a nanometers to several micrometers.

Technical Information:

Type: Woolam Alpha SE

Wavelength: 380 - 900 nm

 

 

Tool name:
Ellipsometer
Area/room:
Clean Room
Category:
Characterization
Manufacturer:
Woolam
Model:
AlphaSE
Tool rate:
A
Max booking time, day:
hours
Max booking time, night:
hours
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