The Flextrua cluster growth tool at the Micro and Nanotechnology Laboratory at the University of Oslo (UiO MiNaLab) is connected to an analysis chamber for advanced sample characterization. A plethora of concomitant surface science techniques are available that utilise a variety of photon sources, a state-of-the-art hemispherical electron analyser and low energy electron diffraction optics. The UPS/ARPES system can resolve the integrated density of states and momentum resolved electronic structure.
System manipulator: Motorised sample manipulator accommodating up to 20 samples with max dimensions of 10x10x1 mm samples. Smaller surface area samples can be measured down to 3x3 mm. UPS analysis on all samples pockets possible, while only the central pocked is possible for ARPES.
Low vacuum: 5x10-7 - 5x10-10 mBar base pressure.
Source: UVS 10/35 ultraviolet helium discharge lamp for 21.2 eV and 40.8 eV photons.
Analyser: PHOIBOS 150 hemisphere electron analyser and 2D CCD detector with real space and angle resolving lens modes.
UPS resolution: 0.1 eV.
Lateral resolution: 0.01 mm.