This is a deep-level transient spectroscopy (DLTS) setup where the temperature is swept in the range of 22K to 320K while the device under test is pulsed at a constant frequency. The device under test is a Schottky diode or a p-n junction. Defect charge state recovery causes the capacitance transient. A capacitance transient after pulses is sampled at 500 000 samples/s. The voltage pulse followed by the defect charge state recovery is cycled allowing an application of different signal processing methods for defect recharging process analysis.

The setup can also perform Minority Carrier Transient Spectroscopy (MCTS) on a Schottky or a p-n diode. The recharging of minority carrier traps can be observed by applying light pulses with the photon energy of 940 nm.

The setup consists of several instruments controlled by a Windows 10 computer using various LabVIEW programs for different purposes. The LabVIEW programs can be found at “C:\Measurements_Idefix\Measurement”.