Rutherford Backscattering Spectrometry (RBS) is an analytical technique based on the measuring of number and energy distribution of fast (1-3 MeV) light ions backscattered from the target. Conventional applications of this technique are the compositional thin film analysis and determination of impurity depth distributions (specifically for heavy elements in light matrix). RBS in combination with channeling provides a possibility for analysis of structural quality of crystalline materials.
The home-made RBS system at UiO MiNaLab is based on 1 MeV NEC Tandem accelerator and 0.5-2 MeV H, Li and He ions can be used as an analyzing beam.
Elements detected: B-U
Depth of analysis < 1mm
Detection limits: 0.001 -10at% (depending on combination of elements in the sample analyzed)
Depth resolution: 5-20 nm
Quantitative without standards
Vacuum compatible materials
It is not possible to apply for a license to the RBS-instrument. This is an instrument which require a dedicated operator. Please contact Christoph Seiffert by email to have samples measured: Christoph.Seiffert@fys.uio.no