Picture of XRD
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WARNING
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Responsibles
1st Responsible:
Christoph Seiffert
2nd Responsible:
Vegard Skiftestad Olsen
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Description

Material Class:

  

Technology Description:

 

 X-ray diffraction is an important method to characterize the structure of crystalline material. The technique can typically be used for the lattice parameters analysis of single crystals, or the phase, texture or even stress analysis of polycrystalline materials. The XRD at UiO MiNaLb has 5-degree of freedom motion control and particularly suitable for thin film characterization.

Technical Information:

 Type: Bruker AXS D8 Discover

 

Details
Tool name:
XRD
Area/room:
XRD-room
Category:
Characterization
Manufacturer:
Bruker
Model:
AXS D8 Discover
Tool rate:
D
Booking
Max booking time, day:
hours
Max booking time, night:
hours
No. of future bookings:
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